Fluke 900 Bedienungsanleitung

FLUKE 900SERVICE MANUALNOTE: This manual documents FLUKE900 instruments S/N 4720000 and above.It also documents any FLUKE 900 vnth the Simulation Opt

Service Manual Introduction FLUKE 900 SERVICE MANUAL©(restart) will re-execute the poweron selftest.©(ignore) will bring up the main screen dir

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FLUKE 900 SERVICE MANUAL Service Manual IntroductionAt any point in the menu tree or any operational mode of the tester, a hard or so

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SchematicsFLUKE 900 SERVICE MANUAL6.2 MICRO BOARD - MB rev.2 (M2)1 Layout Page 13 Schematic Pages

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FLUKE 900 SERVICE MANUALTheory of Operation2 Theory of Operation2.1 GeneralMajor functional blocks of the tester correspond, in general, to

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Theory of OperationFLUKE 900 SERVICE MANUALDuring the test phase, signals received by the H3 are routed immediately to a comparison cir

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SchematicsFLUKE 900 SERVICE MANUAL6.3 HIGH SPEED BOARD - HS rev.2/3 (H3)1 Layout Page 12 Schematic Pages

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FLUKE 900 SERVICE MANUALTheory of Operation2.3 Micro BoardThe Micro Board architecture is shown in the accompanying diagram. Note that, f

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Theory of OperationFLUKE 900 SERVICE MANUALdebouncing and repeating key actions. The itest) and inext) keys found on the Interface Buffe

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FLUKE 900 SERVICE MANUALTheory of OperationMICRD BOARD ARCHITECTURE□sc(1)\/INTCPU (1)CARTRIDGETESTDNMDN BUS (MSB)RS232SPKR,HIGH SPEED BEARD2-5

FLUKE 900 SERVICE MANUALFluke 900 Parts Lists7 Fluke 900 Parts ListsThis section provides parts lists for the 900 and its alphanumerically b

Fluke 900 Parts ListsFLUKE 900 SERVICE MANUAL7.1 900 Final AssemblyFLUKE 0REFERENCEPARTTOTTDESIGNATORS------------—DESCRIPTION-----------------------

FLUKE 900 SERVICE MANUALFluke 900 Parts ListsNFLUKE0REFERENCEPART TOTTDESIGNATORS------------—DESCRIPTION----------------------------NO—QTY--ESUB3SPEA

Fluke 900 Parts ListsFLUKE 900 SERVICE MANUAL7.2 A1 Interface Buffer IBFLUKEN0REFERENCEPART TOT TDESIGNATORS------------... \irsQTY-— IT•“11»B

FLUKE 900 SERVICE MANUALFluke 900 Parts ListsFLUKEN0REFERENCEPARTTOTTDESIGNATORS------------—DESCRIPTION---------------------------NO—QTY--ERN52RN 3X1

Fluke 900 Parts ListsFLUKE 900 SERVICE MANUAL7.3 A2 Micro Board M2FLUKEREFERENCEPART TOTDESIGNATORS------------—DESCRIPTION--------------------------

FLUKE 900 SERVICE MANUALFluke 900 Parts ListsREFERENCE DESIGNATORS---------— —DESCRIPTION-FLUKE PART —NO—TOTQTY-T1T2T1-H,T2-H Ul, U2 U3,U55 U4,U5U6,

Fluke 900 Parts ListsFLUKE 900 SERVICE MANUAL7.4 A3 High Speed H3FLUKEREFERENCE PARTTOTDESIGNATORS------------—DESCRIPTION---------------------------

FLUKE 900 SERVICE MANUALFluke 900 Parts ListsFLUKEREFERENCEDESIGNATORS------------— — nT?c?r*D TPTTnM , .PARTTOTQTY-NOU136,U155,U166,940809U168,U180,U

Theory of Operation FLUKE 900 SERVICE MANUAL2.4 High Speed BoardThe accompanying diagram shows one chamiel routing a signal from the test

Fluke 900 Parts ListsFLUKE 9003ERVICE MANUALA3 High Speed (cent.)FLUKEN0REFERENCEPART TOTTDESIGNATORS----------:-----------------\ir\QTY-— T?U65,U97,U

FLUKE 900 SERVICE MANUALFluke 900 Parts Lists7.5 A4 Power Supply Module PAREFERENCEFLUKEPARTTOTN0TDESIGNATORS-----------------------------—DESCRIPTIO

Fluke 900 Parts ListsFLUKE 900 SERVICE MANUAL7.6 900-Q01 Simulation OptionREFERENCEDESIGNATORS-—DESCRIPTION-NFLUKE ОPART TOT T —NO— QTY- -EU4 9U53U77

TESTCLIPINPUT BUFFER.-UPSwHIGH SPEED BGARDBUFDATABUFDATASYNCLÖAD° QRCKSRCKSYNC_____©SLPTLOAÖSYNCCLKSLFTCLKSYRCENMICRO BOARDDIFTESTBUFFER□UT <DC)©&a

Theory of OperationFLUKE 900 SERVICE MANUALThe busses shown are as follows:EBUSExternal bus represents DUT signals after conversion to TTL le

FLUKE 900 SERVICE MANUAL Theory of Operation8.9.10.11.Diftest BuffersThis circuit uses one of two possible resistor values (Hi or Lo) to

Theory of OperationFLUKE 900 SERVICE MANUAL12. Trig Data LatchThe shift register latches U166, U189, UlOO, U78 are loaded with data indic

FLUKE 900 SERVICE MANUALTheory of Operation2.5 Test ClipsThe standard Test Clips have no active components, but the ribbon cable is temi

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FLUKE 900 SERVICE MANUALSelftest3 Selftest3.1 Reading Selftest ResultsImmediately after poweron, the tester executes a series of selftests

SeiftestFLUKE 900 SERVICE MANUAL3.1.1 General Selftest ResultsThe general results on the first two lines are clustered in groups of five

FLUKE 900 SERVICE MANUALSeiftestTests 0,47 and SO are not automatically run during the poweran selftest, but can be nin by themselves

SeiftestFLUKE 900 SERVICE MANUALBYTEl: Indicates shift register bank which failedB7: INTERFACE BUFFER OB U1,U2,U3,U4)B6: DELAYED GATEB5: SELFTEST (HSB

FLUKE 900 SERVICE MANUAL Selftest3.1.3 Chip Size LED Error CodesIf self test fails, on rare occasions, the chip size LEDs may light to indicate an er

Table of Contents1 Service Manual Introduction...

SeiftestFLUKE 900 SERVICE MANUAL3.2 Running and Reading Individual SelftestsThe individual selftest results indicate which specific lines or

FLUKE 900 SERVICE MANUALSelftestTESTS 1 2PULLO_MON, PULL1_MONThese tests supply a walking 0 or 1 across all lines from the pull-tq)s latch, through th

SeiftestFLUKE 900 SERVICE MANUALTEST 15 PULLPOS_FREQThis test walks a positive pulse through the pull-ups latch to tiie frequency circuitry,TESTS 16,1

FLUKE 900 SERVICE MANUALSelftestNOTE: For test 24, an X in the goieral test result means that individual results areunavailable.TESTS 25,26FM_STAT_NF

SeiftestFLUKE 900 SERVICE MANUALThe bits in the tesults indicate nonnal pin numbers with the exception of the following:BYTE 0 - B7 - NAJ B6- N/UB5 -

FLUKE 900 SERVICE MANUALSelftestIf this test fails it does not set one of the data bits but rather sets the shifting error flag.Frequency HW subtestTh

SeiftestFLUKE 900 SERVICE MANUALResult bytes:BYTE 0 b7- b6- b5- b4- b3-b2- bl -bO-BYTE 1 b7-b6-b5-b4-b3-b2-bl-bO-BYTE 2 b7-b6-b5-b4-b3-0000Threshold

FLUKE 900 SERVICE MANUALSelftestb2 - HW oscillator (25MHz) is too slow. There are several possible causes. The 25MHz crystal could be

SeiftestFLUKE 900 SERVICE MANUALb6 b5b4b3b2blbO15 114 1 131 121 111 101 9TEST 48KEYBOARD_OPENThis test verifies that all keys are in the open

FLUKE 900 SERVICE MANUALSelftest/SHORT is checked to see if the line is hi^ (ie. not shorted to ground). /SYNCEN and /RELEN are test

SeiftestFLUKE 900 SERVICE MANUALTEST 50 UART_TESTThe RSCNT3, RSCNT2, and RSCNTl lines on the Micro Board control the configuration of the

FLUKE 900 SERVICE MANUALSelftestBYTE 2 -RSCNT[3,2,1] = 001 b7-DTR=0, RTS=1, test for CTS=1 b6 - DTR=0, RTS=0, test for CTS=0 b5-DTR=l,

SeiftestFLUKE 900 SERVICE MANUALINVERT FAIL PRE-SCALER 0 DELAY- INF. DUR. - DGATE ACT - DGATE CLR- Note:Could not invert gate signal.A division factor

FLUKE 900 SERVICE MANUALSelftest#1679.000 n 120.00 n161.00 nIXuation - BitO#17199.00 n 240.00 n 281.00 nDuration - Bitl#18439.00 n 480.00 n 521.00 nDu

SeiftestFLUKE 900 SERVICE MANUAL1B71 B6 1 B5 1B4 1B31B21B11BO1+-----IBYTE010|ALL=11TSTONITRIGI1128121271111 FAILI FAILI1 1 1 11+----IBYTE1 131 26 1 4

FLUKE 900 SERVICE MANUALSelftestTEST 54 PULL_XEVENTIf the Simulation Option (900-001) is installed, this test verifies the operation of t

SeiftestFLUKE 900 SERVICE MANUAL1. Manual initialization test:- Manually write all locations with 0.- Read back all locations checking for 0.- Manual

FLUKE 900 SERVICE MANUALSelftestByte 1 - bit 7 is set if any overlay failed. The other bits indicate which overlay failed first When

SeiftestFLUKE 900 SERVICE MANUALTEST E64 SHAD_ADDRThe shadow RAM addressing test takes ^proximately 3 minutes to run.RESULT BYTES:I B7 I B6 I B5 I

FLUKE 900 SERVICE MANUALSeiftestB7 B6 B5 B4 B3 B2 B1 BOBYTE 0 I 0 |BUSY|DATA|ADDR|A11 'lAlO | A91 A8|BYTE 1 I A7I A6 I A5 I A4 | A3

TEST 53 PULLl XTRIG... 3 - 20TEST 54 PUL

SeiftestFLUKE 900 SERVICE MANUALTEST E78 TRG_CROSSThis test verifies that there is no cross talk between lines that can affect the trig

FLUKE 900 SERVICE MANUALSelftest3.4 System Error CodesSystem Error Codes appear on the command line of the 900 when its microprocessor

SeiftestFLUKE 900 SERVICE MANUALIF DEVICE IS MODIFY PROTECTED20 DEVICE IS COPY PROTECTED21 DEVICE IS DELETE PROTECTED22 INVALID FILE TYPE23

FLUKE 900 SERVICE MANUALTroubleshooting4 Troubleshooting4.1 Test Result InterpretationThe first step in troubleshooting is to use the power

TroubleshootingFLUKE 900 SERVICE MANUAL4.2 Selftest / Circuit Block Reference TableThe following table describes state of major hardware blocks durin

STATE OF MAJOR BLOCKS OF HARDWARE FOR EACH TEST (VER. 5.00 AND LATER)CONVENTIONS: A-ACTIVE W-WALKING (LINE BY LINE) S-STATIC P-PULSED(—LO, +-HI) BLAN

Troubleshooting FLUKE 900 SERVICE MANUAL4.3 Selftest Circuit Block DiagramsEach selftest or group of similar selftests is shown on a block diagram wi

TEST CLIP ; INPUT BUFFERMICRO BOARDSIGNAL(10NIT0RK3ÍACTIVITYI10NIT0R-t»IСЛHIGH SPEED BOARDWALKING 1 Ы WALKING ОnONBUS- IN.OUT IM.MDIFTESTCIRCUITOUT (

4^Io>TEST CLIP1.WALKING0 .2.WALKING1MICRO BOARDSIGNAL MONITOR I linfBir<I<KACTIVITYMONITORHIGH SPEED BOARDITHCLATCHSFLFTEITLATCHlUFDATAD 0 C

TEST CLIPINPUT BUFFER1. WALKING 02. WALKING 1OAT A• D•CKSICK«rLFULLSCKEPULiMICRO BOARDSIGNALMONITORACTIVITYriONITORIHIGH SPEED BOARDSTHCLATCHIUFOATA0

I00TEST CLIP : INPUT BUFFERDATA* "LFULLSICKwrSCKSrUL___I____________________IMICRO BOARDSIGNALMONITORACTIVITYMONITORHIGH SPEED BOARD2 & 4.WA

TEST CLIPINPUT BUFFERDATAi вRCKSRCKerLPULLICKCPULJ_________________IMICRO BOARDЬSIGNAL(10NIT0R I LeiIMI• 0nrACTIVITYnONITORЮHIGH SPEED BOARD CKMCKSTAT

TEST CLIPINPUT BUFFERJ_________________ImCRO BOARDSIGNAL ► flONITOR I cnffgf<0^TO CPU <—• DnrKiCACTIVITYnONITORHIGH SPEED BOARD• CK •ICK1. WALKI

TEST CLIPINPUT BUFFERHIGH SPEED BOARD1.VCCRELAYS2.GNDRELAYSAPPLICABLE TESTS1. VCCON-FLT2. GNDON-FLT3.4.CTvmCOooC/)mJ3<oms:>z:c>NOTE: SIGNAL F

TEST CLIP :MICRO BOARD hSIGNALMONITOR• BnKKACTIVITYnONITORHIGH SPEED BOARD•CKsacK« SYNCBUSnONBUSBUFOATAfcrmnorBCKSBCK1BLFTCLKIN.our IN.BODIFTESTCIRC

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TEST CLIP___I____________________IMICRO BOARD-ftSIGNAL M MONITOR I crnwrKKACTIVITYMONITORHIGH SPEED BOARDlUFOATA1 err COWILFTCLKRCKSRCK7MONBUS- ».OUT

TEST CLIP INPUT BUFFER___I________________IMICRO BOARDSIGNALMONITORACTIVITYriONITORcnHIGH SPEED BOARD0••UrOATAiLTmjw00acKsacKSt1,.tUFTCLKacKlacKSYNCBU

TEST CLIP INPUT BUFFERa>MICRO BOARDSIGNALflONITORACTIVITYnONITORHIGH SPEED BOARDMONBUS-EBUS.IN FAULT.IHLATCHING CIRCUITSELECTCLK- OUTn/rFRAMINGCIR

TEST CLIP : INPUT BUFFEREWALKING 0DATA CKSRCKiTLPUUSCKCfULJMICRO BOARD-ts.I-siHIGH SPEED BOARDlUFDATArrircnjTarDRCKSRCKorSTNCCLKSVNCrUSYNCBUSRCKSRCKIN

5.4.2A2 Example 2 (for positive offsets)... 5-105.4.2.5 The Correcting Component

CDTEST CLIPINPUT BUFFER11. STATIC HIGHrULL-UPSLATCH1DATA 1P. STATIC LOWSTNCSEIFTESTSTATIC HIGH0 DLATCHLATCHJ______________________ItllCRO BOARDSIGNALn

TEST CLIPINPUT BUFFERdataRCKSRCK5TLFULLSCKCRULJ JiMICRO BOARD-ftSIGNALMONITORa DnrACTIVITYnONITORICDHIGH SPEED BOARDSTATICHIGH UFDATA1TWCCLKyyjfcrirKC

rooTEST CLIPHIGH SPEED BOARDAPPLICABLE TESTS1.FflXX-FLT*2.3.FnXX-NFLT*4.Ocg;CD0)zroor-i-d'(Q• n - 44.10.120.1(0.200.14«NOTE: SIGNAL FLOW IS SHOWN

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rv)ro_TEST CLIP Í' &. YuWiKiW^-VE PULSE a &. 4 WALKING ♦VE PULSEINPUT BUFFERMICRO BOARD-hSIGNALnONIIORACTIVITYnONITOR1 &. 2 CONTROLLE

FLUKE 900 SERVICE MANUALTroubleshooting4.4 Failure Examples4.4.1 IB ReversalThis failure usually results in error on lines 9, 10, 19, 20.

TroubleshootingFLUKE 900 SERVICE MANUAL4.4.2 Static-blown HSBDamage usually occurs due to touching of J1 or J2 connector. Most of the t

FLUKE 900 SERVICE MANUALTroubleshooting4.4.3 Missing -5 VMostly due to faulty power supply, this failure will affect almost all tests.Filei SELFTEST.

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FLUKE 900 SERVICE MANUALMaintenance5 Maintenance5.1 Performing a Complete System CheckoutThe Basic Functional Test is built into the system

MaintenanceFLUKE 900 SERVICE MANUAL5.2 Performing Adjustments5.2.1 Adjustment to VccThe Vcc level is adjustable over a narrow range around

FLUKE 900 SERVICE MANUALMaintenanceU60SYS-AFU61SYS-BU76SYS-CU77SYS-DU74Custom ]U75StandardThe EPROM positions are shown in the layout diagram

MaintenanceFLUKE 900 SERVICE MANUAL5. Remove the two speaker wires from their mating jacks (upper left area of top half, component side

FLUKE 900 SERVICE MANUALMaintenance5.3.3 Speaker1. Follow steps 1 through 7 in Section 5.3.1.2. Remove the 4 screws which attach the speaker to the

MaintenanceFLUKE 900 SERVICE MANUAL5.3.6 High Speed Board1. Follow steps 1 through 3 in Section 5.3.12. Remove the 7 screws fastening the High Spee

FLUKE 900 SERVICE MANUAL Maintenance5.3.8 Interface Buffer Board1. With the unit turned off, disconnect the J1 and J2 connectors which attach the In

MaintenanceFLUKE 900 SERVICE MANUALThe rest have a common header; "F_MASK offset table". These blocks wiUbe referred to with t

FLUKE 900 SERVICE MANUALMaintenanceadditional capacitorfiQ. 1S.4.2.4 The Offset Shift (OS) DefinitionFor any line that needs to be corrected

MaintenanceFLUKE 900 SERVICE MANUALAccording to table 1 in Section S.4.2.5 , a 47K resistor should be used (it gives OS 5). Other bl

FLUKE 900 SERVICE MANUALMaintenanceTABLE 1 Offset ShiftFluke P/NR4 0 80 120160 200 240365k0 0 01 11921168150k1 12 233921171113k1 2 2 3 449211768 6k2 2

FLUKE 900 SERVICE MANUALService Manual Introduction1 Service Manual Introduction1.1 Description of Operator, Service ManualsDocumentation for the

MaintenanceFLUKE 900 SERVICE MANUALS.4.2.6 Calibration ProcedureAs a preliminary condition, the HS Board must pass all selftests with the

FLUKE 900 SERVICE MANUALMaintenance-2 -115(U-L for pin 2) - (D-L for pin 15) = -2 -1 = -3 (failure)This means that one of the 74ALS09 chips in

MaintenanceFLUKE 900 SERVICE MANUALCheck ifabs((U-H) -(U-L)) = 0,1,2,3,4,5 abs((D-H) -(D-L)) = 0,1,2,3,4,5 abs((U-H)-(U-L)-(D-H)+(D-L)) = 0,1,2,3,4,5

FLUKE 900 SERVICE MANUALMaintenanceprobe B to the output of a related ’86 gate and measure t3 and t4.- Press any key to abort the looping acti

Maintenance FLUKE 900 SERVICE MANUAL5.4.2.6.4 LM360 comparator related conditionEach pair of columns in the calibration results should diffe

FLUKE 900 SERVICE MANUALMaintenanceECO-018This connects the 16th address line to the cartridge buffer. Install wire from U9 pin 3 to J6 pin 30.5.5.2

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FLUKE 900 SERVICE MANUALSchematics6 Schematics6.1 INTERFACE BUFFER - IB1 Layout Page 6 Schematic Pages

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